Electron Microscopy and Analysis, Third Edition (Google eBook)
CRC Press, Nov 30, 2000 - Technology & Engineering - 254 pages
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
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Electron Microscopy and Analysis 1999: Proceedings of the Institute of ...
C. J. Kiely
Limited preview - 1999
Electrons and their interaction with the specimen
The transmission electron microscope
The scanning electron microscope
Chemical analysis in the electron microscope
Other editions - View all
aluminium atom probe atomic number Auger backscattered electrons beam current Bragg Bragg angle calculated camera Chapter composition condenser lens convergence angle crystal spectrometer crystalline dark field image depth of field detected diameter diffracted beam diffraction conditions diffraction pattern discussed dislocation distance edge effect electron beam electron diffraction electron energy electron gun electron probe emitted energy loss equation example excite field emission field ion microscope filament focus fringes increases inelastic scattering instrument intensity ion beam Kikuchi lines lenses light element light microscope magnification material micrograph objective aperture objective lens obtained optical axis orientation parallel parameter particles peak phase pixel planes plasmon possible primary electron ray diagram reciprocal lattice region sampling volume scanning electron microscope screen secondary electrons shown in Figure shows signal solid spatial resolution spectrum spherical aberration structure technique thickness thin specimen tilted transmission electron microscope typical usually wavelength X-ray