Measurement technology and intelligent instruments VI
Trans Tech Publications Ltd., 2005 - Technology & Engineering - 768 pages
The topics covered include measurements for advanced materials, micro and nano measurement, biomedical and environmental measurement, optical precision measurement, form error, displacement and angle measurement, on-line and in-process measurement, micro and nano surface metrology, flow and thermal measurement, sensing systems, mechanical and physical quantity measurement, data, signal and image processing for precision measurement: covering novel designs and techniques in sensor and sensing systems and investigations of the characteristics and performances of precision sensor and sensing systems. The book presents the newest information, for application by active researchers and engineers, and forms the basis for further research in this field which is aimed at creating new and practical instrument systems and processes possessing enhanced functionality, precision and performance; all at reduced cost.
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Measurement Technology and Intelligent Instruments IX: Selected Papers of ...
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Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer
An Embedded FBG Sensor for Dynamic Strain Measurement for a Clamped
Investigation of Nonisothermal Crystallization Behaviors of Poly and Silica
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Effects of Key Parameters on the Performance of a New In-Process ...
 Y. Gao, Z. Tao and S. Tse: Key Engineering Materials, Vol. 238-239 (2003), p. 157. 6. Measurement Technology and Intelligent Instruments VI.
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Materials Science & Engineering
2. Trans Tech Publications Limited, Fax: +41 44 922 1033 Email: firstname.lastname@example.org. Contents. Materials Science .................................. 2 ...
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Automatic Laser Monitoring for Dam Safety kd Yue , X. Zhou and J. Gao
described in Fig.3. According to Fig.3, we can have. 240. Measurement Technology and Intelligent Instruments VI. Page 3 ...
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TDI SIE SB RAS pablic2003
V. Optical measurement technologies and systems for industrial applications [Text] // Measurement technology and intelligent instruments VI / Ed. By ...
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A, B, C, D, E, F. 1, 2005年度华中科技大学《SCIE》检录论文目录. 2, 序号, 作者, 题名, 刊名, 单位, 影响因子. 3, 3, Wang, L; Guo, M; Huang, WH; Lu, XH ...
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