Developments in Electron Microscopy and Analysis: Proceedings of Emag 75 Held at the University of Bristol, 8-11 September 1975

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Academic Press, 1976 - Science - 537 pages
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Contents

Organizing Committee v
Section 2 Instrumental Developments and Electron Optics
43
CAN COMPUTER ALGEBRA LANGUAGES REDUCE ELECTRON OPTICAL DRUDGERY?
57
Section 3 Detectors and Accessories for S E M
85
Analysis and Data Handling
123
Computer Control and Automation of Microprobe
157
4olO OPERATING COMMANDS FOR A COMPUTER CONTROLLED ELECTRONPROBE
163
Section 5 Image Processing Image Reconstruction and Phase Contrast
179
Section 7 Electron Microscopy of Beam Sensitive Materials
287
Section 8 Dynamical and Diffuse Scattering from Crystals and Crystal Defects
345
B Diffuse Scattering from Crystals
369
DIFFUSE SCATTERING IN AN ANIONIC CONDUCTOR WITH THE FLUORITE
382
Scattering from Crystal Defects
393
Section 9 Crystal Boundaries and Interfaces
417
SUPPLEMENTARY ATOMIC DISPLACEMENTS NEAR STACKING FAULTS IN SILICON
429
Section 10 Electron Microscopy and Analysis of Minerals
461

Section 6 High Resolution Microscopy
241
HIGH RESOLUTION MICROSCOPY OF ZONES IN AL ALLOYS
267
STUDIES OF DISORDERED POLYTYPIC SYSTEMS
277
lOoll ELECTRON MICROSCOPY OF GIANT PLATELETS IN DIAMOND
501
Author Index
525
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