Ellipsometer Studies of Silver Single Crystals |
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18 HOURS absorption coefficient absorption curve analyzer readings angle of incidence ANGSTROMS annealed at 500°C annealing and argon ANNEALING FOR 18 approximately bakeout Brillouin zone Computed Oxidation copper critical wavelength cross-hair dielectric constant dispersion curves divided circles effect electric vector vibrating electron electron band structure electropolished surface equations Evaporated Film Fermi surface film thickness increased filter further argon bombardment high temperature vacuum HOURS AT 600°C INITIAL ARGON BOMBARDMENT light beam limiting film literature values measurements mechanically polished surface minutes monochrometer observed obtained optical properties Oxidation of 111 oxide film thickness oxide growth phase change photoelectric interband absorption photomultiplier plane of incidence polarizer and analyzer quarter-wave plate reactor refractive index shown in Figure Silver Crystal silver oxide silvered optical flat single crystals spectrometer axis steady-state film thickness steady-state oxide film Suffczynski surface optical constants telescope and collimator temperature vacuum annealing thermal etching Visible Region wavelength region