Electron-beam sources and charged-particle optics: 10-14 July 1995, San Diego, California

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SPIE, 1995 - Science - 536 pages
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Contents

Retarding field optics with fieldfree sample 252232
44
Aberration analysis of wideangle deflectors and lenses by direct ray tracing and comparison
54
Dynamic correction of aberrations in focusing and deflection systems with shaped beams
66
Copyright

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