Fundamentals of surface and thin film analysis

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North-Holland, 1986 - Science - 352 pages
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Contents

Concepts Units
1
Atomic Collisions and Backscattering
13
Energy Loss of Light Ions and Backscattering
39
Copyright

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Phys. Rev. B 68, 033401 (2003): Goswami and Dev - Nanoscale self ...
lc Feldman and jw Mayer, Fundamentals of Surface and Thin Film Analysis (North-Holland, New York, 1986), p. 121. dk Goswami, B. Satpati, pv Satyam, ...
link.aps.org/ doi/ 10.1103/ PhysRevB.68.033401

VITA: LEONARD C. FELDMAN
"Fundamentals of Surface and Thin Film Analysis," lc Feldman and jw Mayer, (New York: North Holland-Elsevier, 1986); translated into Japanese, ...
www.vanderbilt.edu/ AnS/ physics/ cv/ feldman.htm

Livros online: marka.pt
Título : Fundamentals of Surface and Thin Film Analysis. Tipo : Livro. Autor : Feldman, Leonard C.; Mayer, James W. Editor : Pearson Education Ltd ...
www.marka.pt/ (S(a2vzyxqwphpcf1e0oxvsin3g))/ Produto.Aspx?Artigo=00598900

Literatura!
„Fundamentals of Surface and Thin Film Analysis. Fundamentals of Surface and Thin Film Analysis. Fundamentals of Surface and Thin Film Analysis ...
www.chem.uw.edu.pl/ people/ MSzklarczyk/ pol/ Krystalografia.pdf

Catalyst Characterization
Feldman and jw Mayer, Fundamentals of Surface and Thin Film Analysis (1986),. North-Holland, Amsterdam]. XPS is based on the photoelectric effect: An atom ...
doi.wiley.com/ 10.1002/ 3527602658.ch4

Fundamentals of surface and thin film analysis by lc Feldman and ...
Fundamentals of surface and thin film analysis by lc Feldman and jw Mayer (North-Holland, Amsterdam, 1986) pp. xvui+352, Dfl. 125. ...
adsabs.harvard.edu/ abs/ 1987NIMPB..26..620B

Materjaliteadus
Fundamentals of Surface and Thin Film Analysis. North-Holland: New York, Amsterdam, London. 1986. (Tõlge vene keelde - Mir: Moskva. 1989). ...
www.physic.ut.ee/ mt/ cgi-bin/ ained.pl?id=01.053

講義卒研関係
ゼミは輪読形式でlcFeldman と jwMayer らが著した "Fundamentals of Surface and Thin Film Analysis " の第1章から第9章あたりまでを読みます(年度によって変更...
www.ritsumei.ac.jp/ se/ ~ykido/ lecture-j1.html

Leonard C. Feldman, James W. Mayer. Fundamentals of surface and ...
Fundamentals of Surface and Thin Film Analysis. Sorth-iiolland, Now Pork --Amsterdam -London, 198G,. 332. Seiten, 175 ...
doi.wiley.com/ 10.1002/ crat.2170220503

Centro Brasileiro de Pesquisas Físicas - Biblioteca
Referência. FELDMAN, lc; MAYER, jw Fundamentals of surface and thin film analysis. Amsterdam: North-Holland Publ. Co., 1986.
pergamum.cat.cbpf.br/ biblioteca/ php/ referencia.php?codAcervo=17437& codBib=,& codMat=,

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