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J R SHEPPARD
Comparison of pointsource and pointdetector microscopes
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aberrations amplitude analysis angle angular aperture anode Appl axial biological Boersch brightness cathode cell coherent noise confocal image confocal microscope conventional microscope defocused detector developed diffraction effect electron beam Electron Microscopy electrostatic emission energy fluorescence microscopy fluorescent focal focus focusing Griffith high resolution hologram hologram recording holographic image holographic microscopy holographic system illumination image reconstruction integrated circuit intensity interference fringes interference pattern laser lenses Lett light magnetic magnification method microholographic Microsc numerical aperture object beam object wavefront objective lens observed Optik particles Pawluczyk PEM-Phys phase contrast photoelectron imaging photoelectron micrographs photoelectron microscopy photoemission photographic plate Phys plate H point spread function Proc produced pulsed reference beam Ruska sample scanning electron microscope scanning microscope Section semiconductor Sheppard shown in Fig signal spatial frequency specimen speckle spherical spherical aberration surface techniques thickness transfer function variations voltage wave wavefront wavelength Wilson X-ray