Testing for the 80's: Digest of Papers, 1980 Test Conference, November 11, 12, 13, 1980 |
Common terms and phrases
1980 IEEE Test algorithm alpha particle analog applied approach array automatic bit line bridging faults burn-in calibration cell chip circuit circuitry clock combinational components cost cycle decoder delay faults detection detector device under test diagnostic dynamic RAMS effect electron engineering example failure modes fault simulation Figure filter flip-flops frequency functional test gate hardware IEEE Test Conference implemented input instruction integrated circuits logic matrix measurement memory devices method microprocessor modules node operation output package partitioning problem pulse Reliability sample scan path semiconductor sensitive sequence sequential shift register shmoo plot signal signature soft error soft error rate structure stuck-at faults subnetwork techniques temperature test data test equipment test pattern test program test set test system test vectors tester thorium tion verification VLSI voltage Walsh functions word line zero