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Books Books 41 - 50 of about 50 related to Particle beam microanalysis: fundamentals, methods and applications.    

Electron Microscopy and Analysis 1997, Proceedings of the Institute of ...

Rodenburg - Technology & Engineering - 1997 - 708 pages
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this ...
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Applied Materials Characterization:

W. Katz, P. Williams - Technology & Engineering - 1985 - 483 pages
Symposium WW, Materials Issues in Art and Archaeology IX, held Nov. 29-Dec. 3 at the 2010 MRS Fall Meeting.
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Semiconductor materials and process technology handbook: for very large ...

G. E. McGuire - Computers - 1988 - 675 pages
This handbook is a broad review of semiconductor materials and process technology, with emphasis on very large-scale integration (VLSI) and ultra large scale integration (ULSI ...
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Secondary Ion Mass Spectroscopy of Solid Surfaces

Valentin Tikhonovich Cherepin - Science - 1987 - 141 pages
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern ...
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Principles of Analytical Electron Microscopy

David C. Joy, Alton D. Romig Jr., Joseph Goldstein - Science - 1986 - 448 pages
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy ...
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The Principles and Practice of Electron Microscopy

Ian M. Watt - Science - 1997 - 484 pages
This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable ...
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