5th TC7 Symposium on Intelligent Measurement: Jena, German Democratic Republic, June 10-14, 1986 : proceedings |
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Contents
Preface | 1 |
Model building and parameter estimation | 13 |
Intelligent measurement in clinical medicine | 19 |
Copyright | |
34 other sections not shown
Common terms and phrases
A/D converter accuracy algorithm amplitude analog analysis APDD application artificial intelligence attenuation coefficient automatic automation behaviour calculation calibration channel characteristics circuit coefficient components converter detection determined developed diagnostic dial indicator display distribution dynamic electrical EPROM equipment error estimation evaluation expert system filter frequency function German Democratic Republic hardware hypertext ideal axis IEEE IMEKO implemented input instrument intelligent measurement interface linear machine man-machine system measurement method measuring devices measuring system meter microcomputer microprocessor modules monitoring object obtained operation optical output parameters performed personal computer phase phase jitter position possible problems procedure processor production pulse quantities radial range real-time realized reference rotating roughness run-length sampling scanning sensor solution speed standard structure surface technical technique temperature thermocouple tion tool transducer vibration voltage
Bibliographic information
| Title | 5th TC7 Symposium on Intelligent Measurement: Jena, German Democratic Republic, June 10-14, 1986 : proceedings Volume 10 of Imeko Tc Event Series, No. 10 Issue 10 of IMEKO TC series |
| Authors | Tamás Kemény, International Measurement Confederation |
| Editors | Tamás Kemény, K. Havrilla |
| Edition | illustrated |
| Publisher | Nova Science Publishers, 1988 |
| Original from | the University of Michigan |
| Digitized | Nov 27, 2007 |
| ISBN | 094174339X, 9780941743396 |
| Length | 520 pages |
| Subjects | › Mathematics / Measurement Measurement Measurement/ Congresses Mensuration Optical measurements Optical measurements/ Congresses Technology & Engineering / General |
| Export Citation | BiBTeX EndNote RefMan |