A detailed study of the carrier concentration method of spectrochemical analysis
J. L. Daniel, Hanford Atomic Products Operation. Chemical Research and Development Operation, Hanford Works, U.S. Atomic Energy Commission, United States. Energy Research and Development Administration, United States. National Bureau of Standards. Fracture and Deformation Division, United States. Dept. of Energy. Office of Fusion Energy, United States. National Bureau of Standards
U.S. Atomic Energy Commission, 1960 - Heat resistant alloys - 96 pages
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12 Amps 120 seconds addition AEC-GE RICHLAND AgCl amount amperes applied approximately arc current Arced Samples arcing period Atomic Energy Commission Average burning carrier compound carrier concentration method carrier concentration process Carrier Distillation Method carrier method carrier present carrier procedure composition concentration of carrier containing two percent determined Distillation Curves effect Elapsed Arcing electrode Emission of Impurity eutectic melt excitation Figure 12 filament Ga^O gallium content gallium oxide content impurity materials increased Laboratory main period matrix mechanism melting point microns molybdenum observed occurs percent GagO percent gallium percent sintering period of impurity pyrometer reaction Research sample mass sample material Sample number sample particle samples containing Scribner and Mullin silent period silver chloride sinter and powder sintered portion six percent spectra spectrographic analysis Standard B-880 thereafter thorium total emission tungsten U^Og U^Oq U. S. Atomic Energy uranium oxide vapor phase vapor pressure volatilization WASH X-ray diffraction X-ray fluorescence