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AVALANCHE NOISE CURRENT
DERIVATION OF EQUATION 41
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2eAf 388°K for diode Adlerstein avalanche breakdown avalanche current avalanche field avalanche noise avalanche process avalanche region Berenz bias voltage breakdown C. A. Lee capacitance charge width variation circuit noise current coaxial cavity constant Cornell University current for GaAs depletion width determined diode A13 displacement current Doping profile electric field distribution equation experimental results experimental value factor flicker noise function of bias function of reverse GaAs diode Hi-Lo structure high field diffusivity high frequency Impatt Diode intrinsic response ionization rates Kuvas Lo-Hi-Lo Measured frequency Naqvi narrow junctions noise measurement Noise power non-local effects obtained overlap integral parameters particle current Poisson's equation profile for GaAs Quasistatic Approximation Raytheon reverse bias current saturated velocities saturation current scattering limited velocities Semiconductor short circuit noise shown in Figure space charge region space charge width theoretical theory and experiment Thesis uniform field value of t-j voltage for diode X band