Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films: Proceedings of the 106th Annual Meeting of The American Ceramic Society, Indianapolis, Indiana, USA 2004, Ceramic Transactions, Volume 162
Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh
John Wiley & Sons, Apr 17, 2012 - Technology & Engineering - 86 pages
Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric thin films are included in this volume. Dielectric, piezoelectric and ferroelectric thin films have a tremendous impact on a variety of commercial and military systems including tunable microwave devices, memories, MEMS devices, actuators and sensors. Recent work on piezoelectric characterization, AFE to FE dielectric phase transformation dielectrics, solution and vapor deposited thin films, and materials integration are among the topics included. Novel approaches to nanostructuring, characterization of material properties and physical responses at the nanoscale also is included.
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High Energy Density PLZT Thin Film Capacitors
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acetic American Ceramic Society annealing Appl BARIUM STRONTIUM TITANATE Bi;O BiFeO BIT ﬁlms BST thin ﬁlm CCT ﬁlms Copyright Clearance Center diamond ﬁlms dielectric constant dielectric properties diluted DyMnO electrical ﬁeld electron energy density excess ﬁlm ferroelectric Ferroelectric Thin ﬁgure ﬁlm deposited ﬁlm thickness ﬁlms grown ﬁrst frequency GdMnO growth hexagonal phase high dielectric hysteresis loops indicated interface kV/cm LAO substrate lattice Lead Zirconate Titanate LPE ﬁlms manganites Materials measurements microstructure microwave plasma MV/cm nanostructuring nm thick nucleation observed optical orientation orthorhombic PbO overcoat layer peaks perovskite perovskite ﬁlms perovskite phase Phys plasma PLZT ﬁlm PNZST PNZT polarization polycrystalline PSTO ﬁlm PSTO thin pulsed laser deposition pyrolysis reﬂection room temperature samples scans showed single phase perovskite Society or fee sol-gel solution structure substrate surface thin ﬁlm capacitors Thin Films titanate tunable microwave voltage X-ray diffraction