Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices

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Josef Sikula, Michael Levinshtein
Springer Science & Business Media, Feb 21, 2006 - Science - 368 pages
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A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.

 

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Contents

Noise Sources
3
Noise Sources in GaNAlGaN Quantum Wells and Devices
11
Old Questions
19
1f Spectra as a Consequence of the Randomness of Variance
29
Quantum Phase Locking 1f Noise and Entanglement
37
Planat and H Rosu
44
G Basso and B Pellegrini
53
Stochastic and Deterministic Models of Noise
61
Techniques for HighSensitivity Measurements of Shot Noise
203
Principles and Limits
211
Measurement and Analysis Methods for Random
219
Experimental SetUp
227
Some Considerations for the Construction of LowNoise
237
Measurements of Low Frequency Noise in NanoGrained
245
Technique for Investigation of NonGaussian and NonStationary
253
The Noise Background Suppression of Noise Measuring SetUp
261

Noise in Optoelectronic Devices 71
70
Fluctuations of Optical and Electrical Parameters and Their
79
Microwave Noise and FastUltrafast Electronic Processes
89
Faster is Noisier
109
Noise and Tunneling Through the 2 5 nm Gate Oxide
129
S Ferraton L Montès I Ionica J Zimmermann
144
Tunneling Effects and Low Frequency Noise of GaNGaAlN
161
Informative Passport Data of Surface Nano
177
Noise Measurement Techniques 189
188
Accuracy of Noise Measurements for 1f and GR Noise
271
Radiofrequency and Microwave Noise Metrology
279
E Rubiola and V Giordano
286
Treatment of Noise Data in Laplace Plane
287
Techniques of Interference Reduction in Probe System
303
Optimised Preamplifier for LFNoise MOSFET Characterization
319
Diagnostics of GaAs Light Emitting Diode pn Junctions
337
Using a Novel Computer Controlled Automatic System
355
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About the author (2006)

Levinshtein, The Ioffe Institute of Russian Academy of Science.

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