Advanced Mathematical & Computational Tools in Metrology VII

Front Cover
P. Ciarlini
World Scientific, 2006 - Computers - 363 pages
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This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology. Contents: Modeling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (M Baer et al.); Mereotipological Approach for Measurement Software (E Benoit & R Dapoigny); Data Evaluation of Key Comparisons Involving Several Artefacts (M G Cox et al.); Box-Cox Transformations Versus Robust Control Charts in Statistical Process Control (M I Gomes & F O Figueiredo); Decision Making Using Sensor's Data Fusion and Kohonen Self Organizing Maps (P S Girao et al.); Generic System Design for Measurement Databases Applied to Calibrations in Vacuum Metrology, Bio-Signals and a Template System (H Gro et al.); Repeated Measurements: Evaluation of Their Uncertainty from the Viewpoints of Classical and Bayesian Statistics (I Lira & W Woger); Detection of Outliers in Interlaboratory Testing and Some Thoughts About Multivariate Precision (C Perruchet); On Appropriate Methods for the Validation of Metrological Software (D Richter et al.); Data Analysis-A Dialogue (D S Sivia); Validation of a Virtual Sensor for Monitoring Ambient Parameters (P Ciarlini et al.); Evaluation of Standard Uncertainties in Nested Structures (E Filipe); Linking GUM and ISO 5725 (A B Forbes); Monte Carlo Study on Logical and Statistical Correlation (B Siebert et al.); Some Problems Concerning the Estimate of the Uncertainty of the Degree of Equivalence in MRA Key Comparisons (F Pavese); Preparing for a European Research Area Network in Metrology: Where are We Now? (M Kuhne et al.); and other papers. Readership: Researchers, graduate students, academics and professionals in metrology.
 

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Contents

I
vii
II
13
III
23
IV
35
V
47
VI
60
VII
73
VIII
85
XXV
245
XXVI
253
XXVII
258
XXVIII
262
XXIX
267
XXX
271
XXXI
276
XXXII
280

IX
98
X
108
XI
119
XII
130
XIII
142
XIV
151
XV
161
XVI
171
XVII
179
XVIII
188
XIX
196
XX
204
XXI
212
XXII
221
XXIII
229
XXIV
237
XXXIII
284
XXXIV
289
XXXV
293
XXXVI
297
XXXVII
301
XXXVIII
306
XXXIX
310
XL
316
XLI
320
XLII
325
XLIII
330
XLIV
335
XLV
340
XLVI
344
XLVII
350
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