Advanced Materials 2000: Future and Present of Electron Microscopy : New Methods and Applications in Advanced Materials : Proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29-March 3, 2000
The Institute, 2000 - Electron microscopy - 70 pages
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Disclinations in Boron Nitride and Carbon
Emission of Electrons and Ions from Carbon Nanofibers under High Electric Field
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accelerating voltage ADF image Advanced Materials alloy angle atomic columns Bando bulk carbon nanotubes charge ordering chemical shift chromatic aberration clusters contrast crystal dark field defects defocus density diameter diffuse scattering EELS microscope EELS spectra EFTEM electron beam electron diffraction electron diffraction patterns electronic structure elemental maps energy filtering Energy Loss energy-filtered F Hofer February 29 field emission Fig.l Figure film fullerenes grain boundary graphite HAADF-STEM Hayama high resolution Hitachi HRTEM Inorganic Materials interface Japan Kurashima lattice layers Lett M.Terauchi magnetic field Maignan March metal modulation MWNTs Nagoya nanowire NIRIM nitride nm-sized observed obtained oxides parameter particles peak phase Phys plasmon probe quasicrystals Raveau Research in Inorganic S. J. Pennycook sample Sato scanning shock-compressed shows solid spatial specimen spherical aberration STEM superconductors surface Tanaka technique temperature thickness transmission electron microscopy tubule Ultramicroscopy valence VGCFs vortex vortices Warbichler Z-contrast