Advances in Imaging and Electron Physics, Volume 165

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Academic Press, Feb 14, 2011 - Computers - 339 pages
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
 

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Contents

Chapter 2 Superluminal Subluminal and Negative Velocities in FreeSpace Electromagnetic Propagation
47
The Next Step in Electron Microscopy
73
Chapter 4 Methods for Vectorial Analysis and Imaging in HighResolution Laser Microscopy
131
Chapter 5 Image Hierarchy in Gaussian Scale Space
175
Chapter 6 The Theory of the Boundary Diffraction Wave
265
Chapter 7 History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from XRay Diffraction Measurements
283
Contents of Volumes 151164
327
Index
333
Color Plate
345
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