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IMPACT OF THE PERSONAL COMPUTER ON XRAY ANALYSIS HISTORICAL
SOFTWARE FOR XRD
SOFTWARE FOR XRF
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absorption Advances in X-Ray algorithm analyzed angle applications atomic austenite axis background BPSG Bragg Bragg angle Bragg peak calculated calibration capillary coefficients concentration contamination correction count rate Cryst crystal crystallite curves detection detector determined diffraction data diffraction patterns diffraction peak diffractometer Edited by J.V. effects electron elements energy equation error evaluation EXAFS excitation experimental filter function FWHM goniometer HOPG intensity J.V. Gilfrich lattice parameters layer linear material matrix metal method monochromator multilayer neutron neutron diffraction obtained optical oxide phase photon plane Plenum Press pole figure powder diffraction principal stress ratio refinement residual stress Rietveld sample scan scattering shown shows silicon sin2 specimen spectra spectrometer standard strain structure substrate surface synchrotron radiation Table technique temperature texture thickness thin film toroid total reflection TXRF values wafers X-Ray Analysis X-ray diffraction x-ray fluorescence X-ray tube