Advances in X-Ray Analysis, Volume 28
Charles S. Barrett, Paul K. Predecki, Donald E. Leyden
Plenum Press, 1985 - X-rays - 408 pages
The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.
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Total Reflectance XRay Spectrometry
XRF and Other Surface Analysis Techniques
The Role of XRay Fluorescence in a Modern Geochemical
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absorption edge accuracy alumina analytical angle anode applications atomic number austenite background calcine calculated calibration carbon Chem chemical CLAISSE coefficients collimator component Compton scatter concentration coordination correction count rate crystal monochromator curve deadtime depth detection limits detector determined diffractometer dispersive dolomite effects electron emission energy-dispersive equation error excitation experimental Figure film filter fundamental parameters geochemical Gilo River goniometer Hohokam instrument laboratory light elements linear material matrix measured method monochromatic monochromator obtained oxide phase photons plot polarized powder primary beam procedure quantitative radiation range ratio reflector residual stress sample preparation scan scattering shown shows siderite simulated solution specimen spectra spectrum standard deviation surface Synchrotron Synchrotron Radiation Table target technique temperature thermal thickness tion total reflection TXRF values wavelength width X-ray diffraction X-ray fluorescence X-Ray Fluorescence Analysis X-ray spectrometers x-ray tube