Advances in X-ray Diffractometry and X-ray Spectrography: A Volume of Fifteen Selected Reprints from Philips Laboratories, Irvington-on-Hudson, New York, U.S.A.
Centrex Publishing Company, 1962 - Spectrographs, X-Ray - 233 pages
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COMPARISON OF XRAY WAVELENGTHS FOR POW
GEOMETRY ALIGNMENT AND ANGULAR CALIBRA
ADVANCES IN XRAY DIFFRACTOMETRY OF CLAY
1 other sections not shown
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accuracy alignment angular aperture atomic number axis of rotation background Bragg angle calibration characteristic circuits collimator counting rate crystal monochromator crystallites Cuka curves decreasing detecting detector diffractometer discrimination effect electron error experimental extra reflections factor ﬁg filter ﬁxed ﬂat ﬂuorescence focal spot foils Geiger counter tube goniometer Hamacher increases Instr instrument intensity measurements limited line intensity line profiles line shape Lowitzsch method monochromator Norelco number of counts obtained orientation P/B ratio parallel slit Parrish pattern peak intensity peak-to-background ratio Philips Tech photomultiplier Phys plane powder specimen precision primary beam proﬁle proportional counter pulse amplitude pulse height analyzer radiation receiving slit reciprocal lattice recorded reduced reﬂection reflection angle region scanning speed scintillation counter shift shown in Fig silicon Soller collimator specimen holder specimen surface spectral Table tion tungsten values voltage wavelength width window X-Ray Crystallography X-ray diffraction X-ray optics X-ray spectrochemical analysis X-ray tube