Advances in X-ray Diffractometry and X-ray Spectrography: A Volume of Fifteen Selected Reprints from Philips Laboratories, Irvington-on-Hudson, New York, U.S.A.

Front Cover
William Parrish
Centrex Publishing Company, 1962 - Spectrographs, X-Ray - 233 pages
0 Reviews

From inside the book

What people are saying - Write a review

We haven't found any reviews in the usual places.

Contents

COMPARISON OF XRAY WAVELENGTHS FOR POW
15
GEOMETRY ALIGNMENT AND ANGULAR CALIBRA
50
ADVANCES IN XRAY DIFFRACTOMETRY OF CLAY
73
Copyright

1 other sections not shown

Other editions - View all

Common terms and phrases

Bibliographic information