Advances in materials problem solving with the electron microscope: symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A.

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Materials Research Society, 2001 - Science - 406 pages
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This volume was motivated by the remarkable advances that continue to be made in electron microscope instrumentation and techniques for applications to materials science. Characterization problems can now be tackled that were beyond reach just a few years ago. Advances include quantitative high-resolution imaging, atomic-resolution Z-contrast imaging, elemental mapping by energy-filtered TEM or spectrum imaging, atomic-resolution EELS for composition and bonding, quantitative CBED, site-occupancy determination by ALCHEMI, electron holography, EBSP in the SEM for phase identification and orientation imaging microscopy, low-voltage microanalysis of bulk specimens, and "in situ experiments of dynamic phenomena. In particular, the volume emphasizes how these recent developments in electron microscopy are being used to solve materials problems. It features different groups of materials or microstructural components rather than electron microscope techniques or instrumentation. Papers focus on low-energy electron microscopy of surfaces, crystallography, defects, specimen preparation, and interfaces in metals and ceramics. Technological applications include magnetic materials, microelectronic materials, partially ordered and nanophase materials, polymers, ceramics, metallic alloys, concrete, biomaterials, and glasses.

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Microstructural Characterization of Longitudinal Magnetic
Electron Holography of Nanostructured Magnetic Materials
Flux Mapping and Magnetic Behavior of Grain Boundaries in NdFeB

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