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THEORY OF APPLEYARD
EXPERIMENTAL EQUIPMENT AND PROCEDURES
2 other sections not shown
A.H. Compton absorption adjusted aggregated structure angle of incidence angles greater Angstroms Appleyard assumes battery calculated classical theory component copper films critical angle crystal table decrease diffusion pump electrical electrometer circuit electron beam electron diffraction electron microscope evaporation chamber experimental extinction coefficient film structure film thickness Fresnel equations galvanometer glass substrate gold films granulated grid resistor higher atomic number increased index of refraction intensity curve interface ionization chamber less Lond medium micrometer minutes of arc mirror surface mounted Normalized Reflected Intensity observed curve obtained Ohms optical flat optical properties oxide layer oxygen pressure Parratt Phys plates present study radiation rate of oxidation refractive index resolving power room temperature screw second crystal seconds of arc shown in Figure smearing spectrometer study of thin substrate material substrate surface test flat theoretical curves Thesis thin films thinner films tion total reflection method unity voltage x-ray beam x-ray total reflection