Analytical procedure for evaluating speckle-effect instrumentation
Arthur J. Decker, United States. National Aeronautics and Space Administration, Lewis Research Center
National Aeronautics and Space Administration, 1977 - Technology & Engineering - 31 pages
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adjacent bright speckles analysis suitable approximately assumptions Ax,y Ax;x Central Limit Theorem correlation or spatial corresponding y-polarizations detecting plane detecting surface detector deterministically polarized light Dirac delta function ensemble average equation 9a evaluating speckle Ey at position factorization implied field correlation focal length Fourier transform Fraunhofer diffraction pattern Fresnel diffraction geometrical optics implied by equation impulse response function intensity fluctuation correlation limiting aperture linear transformation normalized correlation optical system phasor physical aperture stop position x,y probability density function propagation of light random randomly polarized light rect reference beam Referring to equation rough surface rough-surface object shown in figure simplified analysis spatial coherence function spatially coherent light speckle effect speckle instrument speckle interfer speckle interferometer speckle pattern statistically independent subscripted superimposed television camera lens third term time-average holography typical area typical extent typical speckle vidicon wide-sense stationary y-polarized field Ey y(Ax