Application Specific Integrated Circuit (ASIC) Technology
Academic Press, Dec 2, 2012 - Computers - 380 pages
Application Specific Integrated Circuit (ASIC) Technology explores and discusses the different aspects of the ASIC technology experienced during the 1990s. The topics of the chapters range from the ASIC business, model, marketing, and development up to its testability, packaging, and quality and reliability.
An introductory chapter begins the discussion and tackles the historical perspective and the classification of the ASIC technology. Chapters 2 and 3 cover the business side of the technology as it discusses the market dynamics and marketing strategies. The following chapters focus on the product itself and deal with the design and model and library development. Computer-aided design tools and systems are included in the discussion. Manufacturing and packaging of ASICs are also given attention in the book. Finally, the last three chapters present the application, testability, and reliability of ASIC technology.
The text can be of most help to students in the fields of microelectronics, computer technology, and engineering.
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Chapter 4 Design and Architecture of ASIC Products
Chapter 5 Model and Library Development
Chapter 6 ComputerAided Design Tools and Systems
Chapter 7 ASIC Manufacturing
Chapter 8 Test and Testability of ASICs
algorithms analog architecture ASIC design ASIC devices ASIC manufacturers ASIC market ASIC products ASIC suppliers ASIC technology ASIC vendor Automation beneﬁt BiCMOS bipolar boundary scan CAD tools CAE companies capacitance cell-based designs channel chip clock CMOS companies complex conﬁgured cost cycle deﬁned delay density design tools difﬁcult electromigration electronic engineers fabrication fanout fault fault coverage ﬁeld ﬁlm ﬁnal ﬁnd ﬁrst ﬁxed ﬂip-ﬂop ﬂow FPGAs function gate arrays I/O counts implementation increase input instruction register integrated circuits interconnect interface layers layout logic logic synthesis mask metal methodology multichip modules netlist optimized output oxide parameters performance pins place and route place/route problem prototype reduced reliability result routing schematic semiconductor signal signiﬁcant silicon compilation simulation single-chip packaging speciﬁc standard cells synthesis techniques test vectors tester tion transistor veriﬁcation voltage wafer wire