What people are saying - Write a review
We haven't found any reviews in the usual places.
INSTRUMENTATION AND PRINCIPLES OF CONTRAST
ELECTRON DIFFRACTION AND WEAKBEAM MICROSCOPY
HIGHRESOLUTION TRANSMISSION ELECTRON MICROSCOPY
4 other sections not shown
Other editions - View all
absorption amplitudes analysis angle atomic number augite axis back focal plane backscattered electron Bloch waves Boland Bragg BSE's Burgers vector Buseck contrast Cowley crystal crystallographic defects deformed minerals detector diffracted beams dislocation densities dynamical ECP's effects electron beam electron channelling electron diffraction emission energy equation Ewald sphere example experimentally deformed exsolution focus Fourier fractures function grain boundaries grid growth high-resolution HRTEM images incident beam incident electrons increases instrument intensity interaction interphase boundary Kohlstedt lamellae magnification McLaren micrographs microstructure Mineralogy naturally deformed nucleation objective lens observed olivine optical orientation orthopyroxene parallel peak phase Phys plagioclase precipitates pyriboles pyroxenes quartz reaction reciprocal lattice resolution result sample scanning electron microscope scattering shown in Figure signal simulation specimen spherical aberration stacking faults structure sub-grain surface symmetry target technique temperature thickness thin tilt transformation transmission electron microscopy twins unit cell Veblen wave wavelength weak-beam Wenk White width X-ray