Applications of synchrotron radiation techniques to materials science: symposium held April 12-15, 1993, San Francisco, California, U.S.A., Volume 1

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Materials Research Society, 1993 - Science - 359 pages
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Absorption spectroscopy: extended fine structure; Absorption spectroscopy: near-edge structure; Structure of surfaces, interfaces, films, and multilayers; Electronic structure; Topography, tomography, microscopy, and materials imaging; X-ray scattering/crystallography and instrumentation.

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Contents

AB INITIO XAFS AND XANES STANDARDS
3
CHARACTERIZATION OF NANOSCALE OXIDE
9
A NEW TECHNIQUE
15
Copyright

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