Applications of synchrotron radiation techniques to materials science 2
Volume I in this series promised that the advent of third-generation light sources would enhance synchrotron-based materials research. This second volume fulfills the promise, featuring many experiments that required newer, higher-brightness sources, and could not have been performed with earlier vintage synchrotrons. The volume focuses on the characterization of reduced dimensional systems, and highlights studies of surfaces, interfaces, polymers, glasses, thin films, magnetic materials, metal systems, multilayers and electronic materials.
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A REALTIME XRAY SCATTERING STUDY OF SPUTTERING GROWTH
A QUANTITATIVE CRYSTALLIZATION STUDY OF THIN AMORPHOUS
RESONANT SOFT XRAY FLUORESCENCE STUDIES OF NOVEL
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alloys analysis angle annealed atoms average band beam beamline binding energy bond distances bulk Burgers vector calcite calculated Ce4+ chemical crystalline curves Debye-Waller factors defects density deposition detector determined dichroism dimer direction dislocations electronic structure emission epitaxy EXAFS EXAFS data experimental Fermi ferromagnetic Figure fluorescence Fourier function growth hysteresis images in-plane incident increase indicate intensity interface interlayer Kevlar lattice layer Lett loops luminescence magnetic magnetic circular dichroism Materials measurements metal micropipes microscopy Mn film multilayers National Laboratory National Synchrotron Light NEXAFS observed obtained optical otavite oxide parameters peak perpendicular phase photoelectron photoemission photon photon energy Phys plane polarized por-Si reflectivity resolution resonant sample scans screw dislocations shows solid spectra spectroscopy sputtering strain substrate surface Synchrotron Light Synchrotron Light Source synchrotron radiation techniques thermal thickness thin films topographs valence band values vector x-ray absorption x-ray diffraction