Applications of thin-film multilayered structures to figured X-ray optics: August 20-22, 1985, San Diego, California
Gerald F. Marshall, Society of Photo-optical Instrumentation Engineers, University of Arizona. Optical Sciences Center, University of Rochester. Institute of Optics
SPIE--the International Society for Optical Engineering, 1985 - Science - 422 pages
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absorption amplitude angle of incidence angular atomic axis B.L. Henke Barbee beam Bragg angle Bragg peak carbon coefficient crystal d-spacing Debye-Waller factor density deposition detector diameter diffraction effect electron ellipsoid ellipsometry equation evaporation experimental factor flux function geometrical grazing angle grazing incidence image plane intensity interface isoangles isobraggs Laboratory laser layer pairs layer thickness LSM's materials matrix measured microscope monitor monochromator multilayer coating multilayer mirror multilayer structures multilayered optical neutron normal incidence number of layers obtained optical constants parameters peak reflectivity performance period photon Phys plasma polarization radiation range ratio ray tracing reflection coefficient reflector region resolution rocking curve sample scanning scattering silicon soft x-ray spectral spectrometer Spiller sputtering stack substrate surface roughness synchrotron thickness errors thin film toroid transmission tungsten vacuum wave wavelength width Wolter x-ray microscope x-ray optics X-ray reflection X-Ray Telescope X-UV