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Various Topographic Methods and Their
Asymmetric Crystal Topography with XRay
XRay Diffraction Topography Description
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absorption amplitude analysis Appl Authier axis beam divergence Bragg angle Burgers vector calculated camera characterization contours contrast corresponding crack tip Crystal Growth curvature cycle defects deformation detector diffraction direction divergence domain domain walls dynamical elastic electron energy Epelboin exit surface experimental experiments ferrimagnetic ferroelectric Figure film fracture geometry grain boundaries hexamine image intensifier implanted incident indentation intensity interaction Kohra Kuriyama lattice Laue layer linear magnetic Materials Science measured metals method Miltat neutron nucleation observed obtained optical orientation oxidation parallel parameter perfect crystal Petroff phase Phys plane wave plastic zone polarization propagation recrystallization region resolution rocking curve rotation sample scattering screw screw dislocations section topograph shows silicon simulated single crystal specimen strain gradient stress structure subgrain substrate SXRF synchrotron radiation technique theory thickness tion topographs transmission values wafer wall wave-fields wavelength Weissmann white beam width X-ray diffraction X-ray topography