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Various Topographic Methods and Their
Piezoelectric and Ferroelectric Materials
Asymmetric Crystal Topography with XRay
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absorption amplitude analysis Appl Authier axis beam divergence Bragg angle Burgers vector calculated camera CARCA characterization contours contrast corresponding crack tip Crystal Growth curvature cycle Daresbury defects deformation detector diffraction direction dislocation density divergence domain dynamical elastic electron Epelboin exit surface experimental experiments factor ferrimagnetic Figure film fracture geometry grain boundaries hexamine image intensifier implanted indentation intensity interaction Kohra Kuriyama lattice Laue layer magnetic materials measured metals method Miltat neutron nucleation observed obtained optical orientation oxidation parallel parameter perfect crystal Petroff phase photocathode photon Phys plane wave plastic zone polarization precipitate propagation recrystallization region resolution rocking curve rotation sample scattering screw screw dislocations section topograph shear stress shows silicon simulated single crystal specimen strain gradient stress structure subgrain substrate SXRF synchrotron radiation technique temperature theory thickness tion topographs transmission values wafer wave-fields wavelength Weissmann white beam width X-ray diffraction X-ray topography