Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques

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Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Springer, Dec 20, 2007 - Technology & Engineering - 465 pages
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The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.
 

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Contents

BackgroundFree Apertureless NearField Optical Imaging
1
MicroNano Scale Thermal Imaging Using Scanning Probe Microscopy
11
References
18
Application of Atomic Force Microscopy to the Study
19
Investigating Individual Carbon NanotubePolymer Interfaces
20
Interaction Forces Measured
21
Scanning Probe Methods in the Magnetic Tape Industry
22
Nanofabrication with SelfAssembled Monolayers
25
Visualization of Polymer Structures with Atomic Force Microscopy
207
References
213
References
214
Fundamentals and Application
215
Scanning Probe Microscopy Applied to Ferroelectric Materials
217
SelfSensing Cantilever Sensor for Bioscience
218
References
231
Morphological and Tribological Characterization of Rough Surfaces
237

Critical Dimension Atomic Force Microscopy
30
Tilman E Schäffer
51
References
52
Surface Characterization and Adhesion and Friction Properties
55
Appendix
56
Carrier Transport in Advanced Semiconductor Materials
63
Ryo Yamada Kohei Uosaki
65
References
73
Qcontrolled Dynamic Force Microscopy in Air and Liquids
75
Probing Macromolecular Dynamics and the Influence
83
References
85
HighFrequency Dynamic Force Microscopy
99
References
105
Towards a Nanoscale View of Microbial Surfaces
111
Torsional Resonance Microscopy and Its Applications
113
References
124
Atomic Force Microscopy of DNA Structure and Interactions
127
References
129
Investigation of Organic Supramolecules by Scanning Probe Microscopy
131
Characterization
148
Modeling of TipCantilever Dynamics in Atomic Force Microscopy
149
Scanning Probe Microscope Application for Single Molecules
153
Chen Wang Chunli Bai
159
Direct Detection of LigandProtein Interaction Using
165
MicroNanotribology Studies Using Scanning Probe Microscopy
171
References
173
References
178
References
181
Scanning Tunneling Microscopy
183
References
201
Quantitative Nanomechanical Measurements in Biology
205
Combined Scanning Probe Techniques
249
Applications of Heated Atomic Force Microscope Cantilevers
251
Displacement and Strain Field Measurements from SPM Images
253
Nanoscale Contacts in Cell Adhesion to Substrates
257
New AFM Developments to Study Elasticity
269
AFM Characterization of Semiconductor Line Edge Roughness
277
References
279
References
280
References
284
NearField Raman Spectroscopy and Imaging
287
Cantilever SpringConstant Calibration in Atomic Force Microscopy
288
AFM Applications for Contact and Wear Simulation
299
Atomic Force Microscopy Studies
303
References
309
References
312
PolarizationModulation Techniques in NearField Optical Microscopy
321
References
327
Noncontact Atomic Force Microscopy
341
Applications to NanoDispersion Macromolecule Material Evaluation
347
References
348
References
349
Automated AFM as an Industrial Process Metrology Tool
359
References
371
References
374
References
411
References
417
TipEnhanced Spectroscopy for Nano Investigation
421
References
446
Subject Index 373
451
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