Architecture Design for Soft Errors

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Morgan Kaufmann, Aug 29, 2011 - Computers - 360 pages

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them.

To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines.

This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture.

  • Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors
  • Shows readers how to quantify their soft error reliability
  • Provides state-of-the-art techniques to protect against soft errors
 

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Contents

Chapter 1 Introduction
1
Chapter 2 Device and CircuitLevel Modeling Measurement and Mitigation
43
Chapter 3 Architectural Vulnerability Analysis
79
Chapter 4 Advanced Architectural Vulnerability Analysis
121
Chapter 5 Error Coding Techniques
161
Chapter 6 Fault Detection via Redundant Execution
207
Chapter 7 Hardware Error Recovery
253
Chapter 8 Software Detection and Recovery
297
Index
327
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Page 2 - These faults arise from energetic particles — such as neutrons from cosmic rays and alpha particles from packaging material — generating electron-hole pairs as they pass through a semiconductor device. Transistor source and diffusion nodes can collect these charges. A sufficient amount of accumulated charge may invert the state of a logic device — such as an SRAM cell, a latch, or a gate — thereby introducing a logical fault into the circuit's operation [32].
Page 20 - Uranium 238 emits an alpha particle. An alpha particle consists of two protons and two neutrons, and, therefore, it is obvious that it is an atom in its own right.

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