Arithmetic Built-in Self-test for Embedded Systems

Front Cover
Prentice Hall PTR, 1998 - Technology & Engineering - 268 pages
0 Reviews
"Arithmetic Built-In Self-Test for Embedded Systems offers a thorough treatment of the important issues in software-based built-in self-test for systems with embedded processors. Fundamental concepts are illustrated with practical scenarios for test generation, test application, and test response compaction." "Arithmetic Built-In Self-Test for Embedded Systems uses an approach to cutting-edge technology that will be of interest to hardware and embedded system designers, test and design engineers, and researchers working on IC/core testing. It is also appropriate for graduate-level design courses. An introductory chapter provides a comprehensive tutorial covering the most relevant DFT and BIST techniques."--BOOK JACKET.Title Summary field provided by Blackwell North America, Inc. All Rights Reserved

From inside the book

What people are saying - Write a review

We haven't found any reviews in the usual places.

Contents

Builtin SelfTest
1
Generation of Test Vectors
61
TestResponse Compaction
87
Copyright

8 other sections not shown

Common terms and phrases

References to this book

All Book Search results »

Bibliographic information