Atom Probe MicroscopyAtom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.
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Contents
1 | |
2 | |
Part II Practical Aspects | 70 |
Part III Applying Atom Probe Techniques for Materials Science | 210 |
Index | 387 |
Other editions - View all
Atom Probe Microscopy Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer No preview available - 2012 |
Atom Probe Microscopy Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer No preview available - 2014 |