Atomic Force Microscopy

Front Cover
OUP Oxford, Mar 25, 2010 - Science - 256 pages
2 Reviews
Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

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Very readable introduction to Atomic Force Microscopy(AFM), with clear illustrations, and comprehensive coverage of AFM modes, AFM instrumentation, how to acquire and optimise images with the AFM, data processing and analysis, and recognising and aaoiding image artifacts. The last chapter covers applications in physical science, nanotechnology, life sciences, and industry. The example applications in this last chapter were chosen to illustrate the capabilities of AFM, and all the modes described in the AFM modes chapter include application examples. This would make a great coursebook for a nanotechnology course, or other course covering nano imaging techniques. 

LibraryThing Review

User Review  - jpeaton - LibraryThing

detailed yet readable guide to atomic force microscopy (AFM), with clear illustrations, and background, usage, theory and applications of the technique. Read full review

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