Atomic Force Microscopy: Understanding Basic Modes and Advanced ApplicationsThis book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com” |
Contents
DistanceDependent Interactions | 33 |
3 | 91 |
4 | 137 |
Phase Imaging | 187 |
Adhesive Nanomechanics | 258 |
Lateral Force Methods | 330 |
Data PostProcessing and Statistical Analysis | 379 |
Advanced Dynamic Force Methods | 400 |
References | 433 |
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Common terms and phrases
acquired adhesion amplitude applied approach approximately atomic attractive attractive forces calibration cantilever capillary Chapter compared components consider constant contains contrast corresponding cycle deflection dependence depicted derived described detail determined direction discussed displacement distance domains drive dynamic effects electronic energy energy dissipation Equation examine example Figure force curves force microscopy frequency friction function given greater height higher increasing interaction interface laser lateral locations magnitude mapping material meaning measurement mechanical meniscus methods mode molecular motion observed offset operation oscillation peak phase Phys physical plot polymer position potential probe produce radius range reduced regime region relationship relative repulsive response result sample scale scan scanner setpoint shear shift shown signal silicon slope solid surface temperature tion tip and sample tip–sample topography usually values variations versus vertical zero