Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

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John Wiley & Sons, Sep 4, 2012 - Science - 488 pages
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This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

“Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

 

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Contents

Acknowledgments
3ModifyingaSurfacewith a
DistanceDependent Interactions
ZDependent Force Measurements
Topographic Imaging
Probing Material Properties I Phase
1Phase Measurementas aDiagnostic of Interaction Regime and Bistability
4 Virial InterpretationofPhase 5 5 Caveats andDataAnalysis Strategies when
Probing MaterialProperties
Probing Material Properties III
Chapter
AdvancedDynamic ForceMethods
Appendices
Index
Copyright

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About the author (2012)

GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.

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