Atomic Scale Interconnection Machines: Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011

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Christian Joachim
Springer Science & Business Media, Apr 23, 2012 - Science - 244 pages
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This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span the subjects of multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements, surface atomic scale mechanical machineries. This state-of-the-art account brings academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

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Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects
2 UltraCompact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm
3 Atomic Scale Interconnection Machine
A UHV Factory for MultiInterconnection of a Molecule Logic Gates on Insulating Substrate
5 Challenges and Advances in Instrumentation of UHV LT MultiProbe SPM System
6 On the Road to MultiProbe NonContact AFM
The Opportunity Challenges and Impact
8 Combined STM and FourProbe Resistivity Measurements on Single Semiconductor Nanowires
10 Surface Conductance Measurements on a MoS2 Surface Using a UHVNanoprobe System
11 MultiProbe Characterization of 1D and 2D Nanostructures Assembled on Ge001 Surface by Gold Atom Deposition and Annealing
12 NanometerScale FourPoint Probe Resistance Measurements of Individual Nanowires by FourTip STM
13 Silicon Surface Conductance Investigated Using a MultipleProbe Scanning Tunneling Microscope
14 AtomicScale Devices in Silicon by Scanning Tunneling Microscopy
15 Electronic Transport on the Nanoscale
16 Solid State Nano Gears Manipulations
17 Probing Single Molecular Motors on Solid Surface

9 Probing Electronic Transport of Individual Nanostructures with Atomic Precision

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About the author (2012)

Dr Christian Joachim is First Class Director of Research at the Centre National de la Recherche Scientifique (CNRS), Nanoscience group (GNS) at CEMES/CNRS Toulouse ( and Adjunct Professor of “Nanosciences and Quantum resources” at ISAE. He coordinated the EU-sponsored projects: BUN ("Bottom-up Nanomachines") and “Pico-Inside” ( and directed 2 NATO Advanced Research Workshops on Nanoscale Sciences in the early 1990’s. He is currently in charge of the French Midi-Pyrenees research effort in Nanoscience (CPER Campus G. Dupouy)" and of the new European Integrated Project “AtMol” ( He is also A*STAR VIP attached to IMRE to develop atomic scale technology in Singapore and WPI in charge of the Toulouse MANA satellite (MEXT Japan).

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