Atomic Resolution Microscopy of Surfaces and Interfaces:, Volume 466
David J. Smith
Materials Research Society, Sep 5, 1997 - Technology & Engineering - 282 pages
There has been a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this book is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.
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Determination of Atomic Structure at Surfaces
Determination of the ThreeDimensional Atomic Structure
The Effect of Strain Relaxation Mechanisms on
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alloy amorphous analysis annealing atomic columns atomic structure beam boundary plane boundary structure bulk Burgers vector CaF2 calculations clusters coherent composition contrast coronene cross-section crystal defects density deposition detector diffraction dimer direction domain EELS effect ELNES energy loss epitaxial etching experimental image facets fault formation fringes geometric phase grain boundary growth HREM HRTEM HRTEM image image simulation intensity ISBN islands lattice layer Lett Materials measured metal micrograph miscut misfit misfit dislocations mismatch nanocrystals nucleation observed obtained orientation oxide oxygen p-n junction parallel parameters partial peak phase phonon photoexcited Phys platelets probe quantitative regions room temperature sample scanning scanning tunneling microscopy scattering angles shown in Figure shows silicide simulated image spacing spatial specimen spectra spectrum step bunches STM image substrate surface techniques thin film TiB2 tilt transmission electron microscopy tunneling twin Ultramicroscopy unit cell Z-contrast image zirconia ZnPc