Automated inspection and high-speed vision architectures III: 6-7 November 1989, Philadelphia, Pennsylvania |
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Contents
INSPECTION METHODOLOGIES AND ALGORITHMS | 87 |
APPLICATIONS AND CASE STUDIES | 171 |
ARCHITECTURES AND ALGORITHMS | 237 |
Copyright | |
1 other sections not shown
Common terms and phrases
additional parameters affine transform algorithm applications approach architecture array automated inspection background binary bundle adjustment calibration camera CESM chip classification Computer Vision coordinates corresponding defects defined determined edge edge detection error feature extraction filter frame function gray level hardware hexagonal Hough transform IEEE image data image processing implementation input integrated integrated circuit IRET keypoints Kiwivision knot angle l.M l.M l.M label landmarks linear octtree machine vision mapping matching mathematical morphology measure method module morphology neural network neurons node object octants Octree operations orientation output parallel performed Photogrammetry pipeline pixel points position probe problem processor quadtree real-time region relation space represent representation resolution robot samples scene scratches seam tracking segmentation sensor septree shown in Figure signal simulation structure surface technique textural threshold Transputer values vector vehicles vertical vision system visual wafer width window workcell
Bibliographic information
| Title | Automated inspection and high-speed vision architectures III: 6-7 November 1989, Philadelphia, Pennsylvania Volume 1197 of Proceedings of SPIE--the International Society for Optical Engineering PROCEEDINGS OF S P I E Volume 1197 of SPIE proceedings sereis Automated inspection and high-speed vision architectures III: 6-7 November 1989, Philadelphia, Pennsylvania |
| Authors | Michael J. W. Chen, Society of Photo-optical Instrumentation Engineers |
| Editor | Michael J. W. Chen |
| Publisher | SPIE, 1990 |
| Original from | the University of Michigan |
| Digitized | Dec 18, 2007 |
| ISBN | 0819402362, 9780819402363 |
| Length | 310 pages |
| Subjects | › Computer architecture Computer vision Computer vision/ Congresses Computers / Computer Architecture Computers / Computer Vision & Pattern Recognition Engineering inspection Pattern recognition systems Quality control Quality control/ Optical methods/ Automation/ Congresses Technology & Engineering / General |
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