Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications
Academic Press, Oct 23, 2000 - Technology & Engineering - 417 pages
The structure of a growth or an etch front on a surface is not only a subject of great interest from the practical point of view but also is of fundamental scientific interest. Very often surfaces are created under non-equilibrium conditions such that the morphology is not always smooth.
In addition to a detailed description of the characteristics of random rough surfaces, Experimental Methods in the Physical Sciences, Volume 37, Characterization of Amorphous and Crystalline Rough Surface-Principles and Applications will focus on the basic principles of real and diffraction techniques for quantitative characterization of the rough surfaces. The book thus includes the latest development on the characterization and measurements of a wide variety of rough surfaces. The complementary nature of the real space and diffraction techniques is fully displayed.
* An accessible description of quantitative characterization of random rough surfaces and growth/etch fronts
* A detailed description of the principles, experimentation, and limitations of advanced real-space imaging techniques (such as atomic force microscopy) and diffraction techniques (such as light scattering, X-ray diffraction, and electron diffraction)
* Characterization of a variety of rough surfaces (e.g., self-affine, mounded, anisotropic, and two-level surfaces) accompanied by quantitative examples to illustrate the essence of the principles
* An insightful description of how rough surfaces are formed
* Presentation of the most recent examples of the applications of rough surfaces in various areas
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Chapter 4 RealSpace Surface Profiling Techniques
Chapter 5 Effects of Finite Tip and Sample Sizes
Chapter 6 Diffraction TechniquesFundamentals
Chapter 7 Diffraction from Random Rough Surfaces
Chapter 8 Diffraction TechniquesExperimentation
Chapter 14 Transition to Multilayer Structures
Chapter 15 Transmission Diffraction and Fractals
Appendix A Growth Dynamics
Appendix B Time Evolution of the Interface Width in the Edwards Wilkinson Equation
Appendix C Effect of Different Functional Forms of the Scaling Function on the Shape of the Diffraction Profile
Appendix D Joint Distributions of Random Processes with NonGaussian Height Distributions
Appendix E Height Difference Function Ck_1 r for Different Height Distributions
Chapter 9 SelfAffine Fractal Surfaces
Chapter 10 Mounded Surfaces
Chapter 11 Anisotropic Surfaces
Chapter 12 NonGaussian Surfaces
Chapter 13 TwoDimensional Fractal Surfaces
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Characterization of Amorphous and Crystalline Rough Surface: Principles and ...
Yiping Zhao,Gwo-Ching Wang,Toh-Ming Lu
No preview available - 2001
6-peak intensity AFM images amplitude anisotropic surface anisotropy atomic auto-correlation function Brillouin zone Chapter characteristic function curve deposition detector determined diffraction intensity diffraction profile diffraction structure factor diffuse profile direction discussed dynamic effect electric field electron Equation Fourier transform fractal fractal dimension FWHM Gaussian distribution Gaussian surface geometry growth front height difference function height-height correlation function in-plane increases intensity oscillation interface width isotropic Langevin equation lateral correlation length lattice Lett light scattering measured mode molecular beam epitaxy momentum transfer mounded surface near-in-phase Néel wall obtained one-dimensional out-of-phase condition peak Phys position power law power spectrum random rough surface ratio real-space RMS roughness roughening roughness exponent roughness parameters scaling scan self-affine surface shown in Figure shows slope substrate surface fractal surface height distribution surface morphology surface roughness thin film tion values Wang wave wave vector Zhao