Characterization of High Tc Materials and Devices by Electron Microscopy

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Nigel D. Browning, Stephen J. Pennycook
Cambridge University Press, Jul 6, 2000 - Science
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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

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1 Highresolution transmission electron microscopy
2 Holography in the transmission electron microscope
3 Microanalysis by scanning transmission electron microscopy
4 Specimen preparation for transmission electron microscopy
5 Lowtemperature scanning electron microscopy
6 Scanning tunneling microscopy
7 Identification of new superconducting compounds by electron microscopy
8 Valence band electron energy loss spectroscopy EELS of oxide superconductors
9 Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7
transport properties and structure
11 The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7Delta
12 Microstructures in superconducting YBa2Cu3O7 thin films
13 Investigations on the microstructure of YBa2Cu3O7 thinfilm edge Josephson junctions by highresolution electron
14 Controlling the structure and properties of high T thinfilm devices

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