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Industrial Implications of Crystal Quality
The Technical Importance of Growth Defects
Defects and their Detectability in MeltGrown
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Characterization of Crystal Growth Defects by X-Ray Methods (Applications of ...
B. K. Tanner
No preview available - 2014
absorption Acta Cryst amplitude angular annealing Appl atoms Authier axis B.K. Tanner Bloch wave Bonse Borrmann Bragg angle Bragg condition Bragg peak Bragg planes Bragg reflection Burgers vectors camera contrast Crystal Growth defects deformation detector devices diffracted beam diffractometer diffuse scattering dislocation density dislocation line dispersion surface divergence double crystal effect electron emulsion energy equation etching experimental experiments facet factor field Figure geometry germanium goniometer grown-in integrated intensity interface Kohra Laue layer material measured melt method observed obtained optical orientation parallel parameter Pendellosung fringes perfect crystal phase photon Phys plane wave polarization projection topograph range ray optics reciprocal lattice region resolution rocking curves rotation sample section topograph shown in Fig shows silicon single crystal solution specimen stacking fault strain structure synchrotron radiation techniques thickness tube wafers wavefield wavelength wavevectors white beam width X-ray diffraction X-ray topography Y-ray