Diffraction X-Ray Optics
Institute of Physics Pub., 1996 - Science - 162 pages
Diffraction X-ray Optics provides a systematic description of the performance and mathematical properties of diffraction x-ray optical elements based upon artificially made microstructures. This description is presented both theoretically (using kinematic diffraction theory and classical optics) and experimentally (including details of the experimental verification of theoretical data). The microstructures which are considered include: plane zone plates, two and three dimensional gratings, multilayer mirrors and three dimensional Fresnel structures.
The book also includes a detailed description of the main principles, technology and applications of both Bragg-Fresnel multilayer optics and x-ray Fourier optics. Special attention is paid to coherent phenomena in the x-ray region, x-ray holography and Bragg-Fresnel optics and with chapters covering absorption and refraction, planar diffraction, volume holography, fabrication techniques and microscopy this book will prove a useful sourcebook to both researchers and development engineers in the field.
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Planar diffraction optics
Synthesized threedimensional BraggFresnel Xray optics
3 other sections not shown
aberrations amplitude analysis aperture atomic axis Bragg Bragg angle Bragg-Fresnel lens Bragg-Fresnel optical calculated coherent corresponding cross section crystal deposition described detector diameter diffraction optics diffraction orders efficiency electron beam ellipsoidal energy etching experimental exposure fabrication factor Figure film fluorescence focal length focal plane focal spot focusing Fourier images Fresnel diffraction Fresnel zone plate function given hologram image transfer incident kinoform Kirkpatrick-Baez layer lenses mask materials maximum membrane microscope modulation multilayer mirror multilayer structure nanometre number of zones object obtained optical constants optical system optimum parameters period phase shift phase zone plate photoelectron photons photoresist pinhole polyimide probe produced proximity effects reflection coefficient refractive index resist resolving power sample scanning scattering silicon soft X-ray spatial resolution spectrum spherical substrate surface surface acoustic wave synchrotron radiation thickness total external reflection transmission wavelength width X-ray beam X-ray microscopy X-ray optical X-ray optical elements X-ray range