Effect of simulated space radiation on selected optical materials
National Aeronautics and Space Administration, 1972 - Technology & Engineering - 14 pages
The effect of simulated Nimbus spacecraft orbital (1100 km, circular, and polar) radiation on wide bandpass glass filters, narrow bandpass thin film interference filters, and several fused silicas was determined by transmittance measurements over the 200 to 3400 nanom wavelength region. No changes were observed in the filters, which were shielded with fused silica during irradiation, after exposure to a 1-year equivalent orbital dose of electrons, nor in the fused silicas after the same electron exposure plus a 1-year equivalent dose of protons. Exposure to a 1/2-year equivalent dose of solar ultraviolet radiation caused a significant degradation in the transmittance of two ultraviolet-transmitting interference filters but had no effect on two colored glass filters that transmitted in the visible and near infrared regions. As a result of the ultraviolet exposure the fused silicas exhibited losses of several percent over the 200- to 300 nanom wavelength region.
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1.0-MeV energy 103 WAVELENGTH nm 20 BEFORE IRRADIATION 7940 fused silica approximately bandpass bremsstrahlung colored-glass filters Corning 7940 fused cryolite degradation direct radiation Dynasil 1000 substrates EFFECT OF SIMULATED electron and ultraviolet electron energies electrons of 1.0-MeV electrons of energies electrons plus ultraviolet energies 0.3 equivalent dose EUVSH AT 3.5 exhibited exposed to electrons exposed to ultraviolet filter was shielded Fluence MeV flux of 2.7 FUVSH hours after irradiation Infrasil II fused IRRADIATION 102 IRRADIATION AFTER IRRADIATION irradiation at 3.5 IRRADIATION BY 1.0-MeV irradiation by electrons narrow-bandpass interference filters Nicoletta and A. G. Nimbus orbit nm Figure Performing Organization radiation at 2.0 radiation by 3.1 Sacher Reference samples were exposed Schott Filter Glass SELECTED OPTICAL MATERIALS shielded from direct shielded with fused shown in Figure silicas were exposed solar radiation solar-viewing channels spectrophotometer Suprasil-W thin-film interference filters torr total flux transmittance measurements ultraviolet exposure ultraviolet irradiation ultraviolet radiation UVSC wide-bandpass glass filters