Electron Microscopy, 1984: Proceedings of the Eighth European Congress on Electron Microscopy, Budapest, Hungary, August 13-18, 1984, Volume 1
P. R÷hlich, Dezső Szabˇ, Hungarian Group for Electron Microscopy, Committee of European Societies for Electron Microscopy, International Federation of Societies for Electron Microscopy
Programme Committee of the Eight European Congress on Electron Microscopy, 1984 - Science - 2402 pages
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aberration accelerating voltage alloy analysis analytical angle atomic Auger austenite axis Bloch waves Boersch brightness Burgers vector calculated carbon cathode chromatic aberration contrast defects defocus density detector diameter diffraction pattern dislocation distribution effect electron beam electron diffraction electron optical emission energy loss experimental field foil fracture function goniometer grain boundary high resolution HREM intensity interface investigations irradiation lattice image layer lenses magnetic magnification martensite materials Materials Science matrix measured metals method microanalysis micrograph microscope mode objective lens observed obtained orientation oxide parameters particles phase Phys plane polepiece precipitates probe Proc processing sample Scanning Electron Microscopy scattering sealing film Shiojiri shown in Fig shows signal specimen chamber spectra spectrometer spectroscopy spectrum spherical aberration steel structure surface technique temperature thickness thin tilt tion transmission electron microscope Ultramicroscopy vacuum values vector voltage X-ray