Electron Microscopy And Analysis
A comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline and non-crystalline materials.
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alloy aluminium angle atomic number Auger backscattered electrons beam current beam of electrons Bragg Bragg angle calculated Chapter characteristic X-rays condenser lens contrast convergence depth of field detected diameter diffracted beam diffraction pattern diffraction spots disc discussed dislocation distance edge effect electron beam electron diffraction electron energy electron gun electron probe emitted energy electrons energy loss equation Ewald sphere example excite fault field ion microscope filament fluorescence focus fringes inelastic scattering instrument intensity ions Kikuchi lines light element light microscope magnification materials micrograph objective aperture objective lens obtained optical axis orientation parameter particles peak phase plane plasmon possible primary electron quantitative analysis Ray diagram reciprocal lattice region sampling volume scanning electron microscope screen secondary electrons seen shown in Figure shows signal solid spatial resolution spectrum spherical aberration surface technique thickness thin specimen tilt transmission electron microscope typical voltage wavelength