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Analytical electron microscopy
The refinement of oxide structures
Advanced spatially resolved electronic structure analysis
39 other sections not shown
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1999 IOP Publishing aberration alloys alumina amorphous Analysis Group Conf angle annealing anorthite atomic beam splitter bonding calculated carbon ceramic composition contrast crystal crystalline crystallites deconvolution density deposition detected detector determined diffraction patterns diffusion dislocations domain EBSD edge EELS electron beam electron diffraction Electron Microscopy ELNES energy loss epitaxial experimental field Figure filter grain boundary graphite HREM images HRTEM intensity interface IOP Publishing Ltd lattice layer lens magnetic material matrix measured metal micrograph Microscopy and Analysis microstructure misorientation monoclinic nanometre observed obtained orientation oxide oxygen Paper presented parameters particles peak phase Phys plane precipitates presented at Electron probe ratio region sample scanning scanning electron microscope scattering secondary electron Sheffield shown in Fig shows simulation spatial resolution specimen spectra structure substrate surface technique temperature thickness tilt transmission electron transmission electron microscopy unit cell voltage Wien filter X-ray YBCO zone axis