Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

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CRC Press, Jan 1, 1997 - Technology & Engineering - 708 pages
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Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
 

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Contents

A synchrotron in a microscope
17
the future
31
The teaching of TEM by telepresence microscopy over the internet
45
Utilisation of beamblanking in electron beaminduced voltage contrast studies
61
A novel ultrasharp field emission electron source demonstrated in a STEM
65
Electrostatic inline monochromator for Schottky field emission
81
High resolution electron microscopy
95
Direct structure determination by atomicresolution incoherent STEM imaging
109
comparing experimental with simulated
125
Quantitative measurement of symmetry in CBED patterns
141
Atom images and diffraction patterns of high Tc superconductors photographed
155
S M Saifullah C B Boothroyd G A Botton and C J Humphreys 67
171
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