Electron Microscopy and Analysis, Third Edition

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CRC Press, Nov 30, 2000 - Technology & Engineering - 254 pages
2 Reviews
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
 

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Contents

Microscopy with light and electrons
1
12 Methods of image formation
2
13 Pixels
3
14 The lightoptical microscope
4
15 Magnification
7
16 Resolution
8
17 Depth of field and depth of focus
12
18 Aberrations in optical systems
14
52 Obtaining a signal in the SEM
124
53 The optics of the SEM
131
54 The performance of the SEM
133
55 The ultimate resolution of the SEM
135
56 Topographic images
141
57 Compositional images
146
58 Crystallographic information from the SEM
149
59 The use of other signals in the SEM
153

19 Electrons versus light
16
110 Questions
19
Electrons and their interaction with the specimen
20
23 Generating a beam of electrons
24
24 Deflection of electrons magnetic lenses
27
25 The scattering of electrons by atoms
29
26 Elastic scattering
30
27 Inelastic scattering
31
28 Secondary effects
34
29 The family of electron microscopes
37
210 Questions
38
Electron diffraction
40
31 The geometry of electron diffraction
41
32 Diffraction spot patterns
47
33 Use of the reciprocal lattice in diffraction analysis
51
34 Other types of diffraction pattern
58
35 Questions
64
The transmission electron microscope
66
42 Contrast mechanisms
76
43 High voltage electron microscopy HVEM
108
44 Scanning transmission electron microscopy STEM
110
46 Questions
121
The scanning electron microscope
122
510 Image acquisition processing and storage
159
511 The preparation of specimens for examination in the SEM
162
512 Low voltage microscopy
164
513 Environmental scanning electron microscopy ESEM
166
514 Questions
167
Chemical analysis in the electron microscope
169
61 The generation of Xrays within a specimen
170
62 Detection and counting of Xrays
174
63 Xray analysis of bulk specimens
184
64 Xray analysis of thin specimens in the TEM
193
65 Quantitative analysis in an electron microscope
196
66 Electron energy loss spectroscopy EELS
205
67 A brief comparison of techniques
212
68 Questions
213
Electron microscopy and other techniques
214
72 Complementary analysis techniques alternative analysis systems
225
73 Complementary diffraction techniques
233
74 Summary
234
Further reading
236
Answers
238
Index
243
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About the author (2000)

John Humphreys is the author of 28 previous books and is a regular contributor to Shooting Times, The Field, and Country Life.

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